6 results
Microscale Measurement of Stresses in a Silicon Flexure Using Raman Spectroscopy
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- Journal:
- MRS Online Proceedings Library Archive / Volume 741 / 2002
- Published online by Cambridge University Press:
- 11 February 2011, J9.5
- Print publication:
- 2002
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High-resolution thermoreflectance microscopy
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- Journal:
- MRS Online Proceedings Library Archive / Volume 738 / 2002
- Published online by Cambridge University Press:
- 11 February 2011, G12.9
- Print publication:
- 2002
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Self-Interference Fluorescent Emission Microscopy for Biological Imaging
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- Journal:
- Microscopy and Microanalysis / Volume 7 / Issue S2 / August 2001
- Published online by Cambridge University Press:
- 02 July 2020, pp. 36-37
- Print publication:
- August 2001
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Lateral Coupling of Self-Assembled Quantum Dots Studied by Near-Field Spectroscopy
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- Journal:
- MRS Online Proceedings Library Archive / Volume 571 / 1999
- Published online by Cambridge University Press:
- 10 February 2011, 89
- Print publication:
- 1999
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Carrier Dynamics Studies of Thick GaN Grown by HVPE
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- Journal:
- MRS Online Proceedings Library Archive / Volume 595 / 1999
- Published online by Cambridge University Press:
- 03 September 2012, F99W11.47
- Print publication:
- 1999
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MBE Growth and Optical Characterization of InGaN/AlGaN Multiquantum Wells
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- Journal:
- MRS Online Proceedings Library Archive / Volume 449 / 1996
- Published online by Cambridge University Press:
- 10 February 2011, 185
- Print publication:
- 1996
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